22 citations · 34 across the 7 of their papers we have counts for
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cond-mat.mtrl-sci2012★ 3 cited
Sub micron-precision sample holder for accurate re-positioning of samples in Scanning Force Microscopy
José Abad, Juan Francisco González Martínez, Jaime Colchero Paetz
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on th…
cond-mat.mtrl-sci2012★ 5 cited
Calibration of oscillation amplitude in Dynamic Scanning Force Microscopy
Juan Francisco González Martínez, Inés Nieto Carvajal, Jaime Colchero Paetz
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process t…