activity
20062021
most citedReconstructing Detailed Line Profiles of Lamellar Gratings from GISAXS Patterns with a Maxwell Solver

39 citations · 279 across the 16 of their papers we have counts for

collaborators

16 papers

physics.app-ph2021★ 3 cited

Grazing incidence X-ray fluorescence based characterization of nanostructures for element sensitive profile reconstruction

Anna Andrle, Philipp Hönicke, Philipp Schneider +6

For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Usi…

physics.app-ph2021★ 19 cited

On uncertainties in the reconstruction of nanostructures in EUV scatterometry and grazing incidence small-angle X-ray scattering

Analía Fernández Herrero, Victor Soltwisch, Mika Pflüger +2

Increasing miniaturization and complexity of nanostructures require innovative metrology solutions with high throughput that can assess complex 3D structures in a non-destructive m…

physics.app-ph2020★ 20 cited

Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures

Philipp Hönicke, Anna Andrle, Yves Kayser +6

The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor…

physics.app-ph2019

The refined EUV mask model

I. A. Makhotkin, M. Wu, V. Soltwisch +2

A refined model of an extreme ultraviolet (EUV) mask stack consisting of the Mo/Si multilayer coated by a Ru protective layer and a TaBN/TaBO absorber layer was developed to facili…

physics.comp-ph2019★ 12 cited

A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence

K. V. Nikolaev, V. Soltwisch, P. Hoenicke +6

Following the recent demonstration of grazing-incidence X-ray fluorescence (GIXRF) based characterization of the 3D atomic distribution of different elements and dimensional parame…

physics.app-ph2019★ 24 cited

Applicability of the Debye-Waller damping factor for the determination of the line-edge roughness of lamellar gratings

Analía Fernández Herrero, Mika Pflüger, Jürgen Probst +2

Periodic nanostructures are fundamental elements in optical instrumentation as well as basis structures in integrated electronic circuits. Decreasing sizes and increasing complexit…