collaborators

5 papers

cs.CV2026

SafeRestore: Detector-Relative Risk Certificates for Selective Industrial Image Restoration

Shaoliang Yang, Jun Wang

Industrial inspection pipelines often restore a measured image before a detector acts on it, yet restoration can suppress detector-supported defect structure or create clean-region…

cs.CE2026

When a positive SIMP density floor is not enough: solver admissibility and guarded floor selection in matrix-free 3D topology optimization

Shaoliang Yang, Jun Wang, Yunsheng Wang

In a matrix-free geometric-multigrid FGMRES solver for three-dimensional SIMP topology optimization, a reported converged solve is not always a converged solve. On four of 102 held…

cs.CV2026

Does Super-Resolution Preserve Defect Evidence? A Low-False-Call Benchmark for Semiconductor Inspection

Shaoliang Yang, Jun Wang

Super-resolution can make inspection images appear sharper without preserving the evidence needed to detect a defect. We study this failure mode with a benchmark that separates rec…

cs.CE2026

Empirical Calibration and Conditional-Reliability Diagnostics for Bearing RUL Prediction under Operating-Regime Shift

Shaoliang Yang, Jun Wang, Yunsheng Wang

Remaining useful life (RUL) estimates support reliability and maintenance decisions only if both point accuracy and prediction intervals remain trustworthy when operating condition…

cs.CE2026

Large Language Models as Optimization Controllers: Adaptive Continuation for SIMP Topology Optimization

Shaoliang Yang, Jun Wang, Yunsheng Wang

We present a framework in which a large language model (LLM) acts as an online adaptive controller for SIMP topology optimization, replacing conventional fixed-schedule continuatio…