most citedSurface Structuring of Patterned 4H-SiC Surfaces Using a SiC/Si/SiC Sandwich Approach

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cond-mat.other2024

Observation and manipulation of charge carrier distribution at the SiO/Si interface

Maria M. Martins, Piyush Kumar, Marianne E. Bathen +3

Using low-energy muons, we map the charge carrier concentration as a function of depth and electric field across the \SiOSi interface up to a depth of \SI{100}{\nano\meter} in Si-b…