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20032025
most citedQuantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

120 citations · 507 across the 17 of their papers we have counts for

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Showing 2014 · cond-mat.mtrl-sciShow all

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cond-mat.mtrl-sci2014★ 48 cited

Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies

Eugene A. Eliseev, Anna N. Morozovska, Anton V. Ievlev +4

Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and elec…