22 citations · 36 across the 6 of their papers we have counts for
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physics.app-ph2022★ 22 cited
AFM-based Hamaker Constant Determination with Blind Tip Reconstruction
Benny Ku, Ferdinandus van de Wetering, Jens Bolten +3
Particle contamination of extreme ultraviolet (EUV) photomasks is one of the numerous challenges in nanoscale semiconductor fabrication, since it can lead to systematic device fail…
physics.app-ph2020★ 14 cited
Dielectric particle lofting from dielectric substrate exposed to low energy electron beam
P. V. Krainov, V. V. Ivanov, D. I. Astakhov +4
The particle-in-cell simulation is applied to study a nanometer-sized dielectric particle lofting from a dielectric substrate exposed to a low energy electron beam. The article dis…