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researcher

Zehao Lin

3 papers here

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author3

Across the 3 of 3 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci3
same name
  • Zehao Lin — 5 papers
  • Zehao Lin — 5 papers
  • Zehao Lin — 5 papers
  • Zehao Lin — 1 paper, h 2
  • Zehao Lin — 1 paper

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

most citedScaled indium oxide transistors fabricated using atomic layer deposition

304 citations · 610 across the 3 of their papers we have counts for

collaborators

3 papers

cond-mat.mtrl-sci2022★ 304 cited

Scaled indium oxide transistors fabricated using atomic layer deposition

Mengwei Si, Zehao Lin, Zhizhong Chen +3

In order to continue to improve integrated circuit performance and functionality, scaled transistors with short channel lengths and low thickness are needed. But the further scalin…

cond-mat.mtrl-sci2020★ 223 cited

Why In2O3 Can Make 0.7 nm Atomic Layer Thin Transistors?

Mengwei Si, Yaoqiao Hu, Zehao Lin +7

In this work, we demonstrate enhancement-mode field-effect transistors by atomic-layer-deposited (ALD) amorphous In2O3 channel with thickness down to 0.7 nm. Thickness is found to…

cond-mat.mtrl-sci2020★ 83 cited

Scaled Atomic-Layer-Deposited Indium Oxide Nanometer Transistors with Maximum Drain Current Exceeding 2 A/mm at Drain Voltage of 0.7 V

Mengwei Si, Zehao Lin, Adam Charnas +1

In this work, we demonstrate scaled back-end-of-line (BEOL) compatible indium oxide (In2O3) transistors by atomic layer deposition (ALD) with channel thickness (Tch) of 1.0-1.5 nm,…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.