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physics.app-ph2025
Hysteresis Measurements as a Diagnostic Tool: A Systematic Approach for Stability Benchmarking and Performance Projection of 2D-Materials-Based MOSFETs
Alexander Karl, Dominic Waldhoer, Theresia Knobloch +19
Judging by its omnipresence in the literature, the hysteresis observed in the transfer characteristics of emerging transistors based on 2D-materials is widely accepted as an import…
cond-mat.mes-hall2025
Investigation of Low Frequency Noise in CryoCMOS devices through Statistical Single Defect Spectroscopy
Edoardo Catapano, Anirudh Varanasi, Philippe Roussel +9
High 1/f noise in CryoCMOS devices is a critical parameter to keep under control in the design of complex circuits for low temperatures applications. Current models predict the 1/f…