27 citations · 31 across the 3 of their papers we have counts for
5 papers
Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayer superlattices
S. Psilodimitrakopoulos, A. Orekhov, L. Mouchliadis +7
Atomically thin two-dimensional (2D) materials can be vertically stacked with van der Waals bonds, which enable interlayer coupling. In the particular case of transition metal dich…
Wide field of view crystal orientation mapping of layered materials
A. Orekhov, D. Jannis, N. Gauquelin +10
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi-…
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Viveksharma Prabhakara, Daen Jannis, Giulio Guzzinati +3
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors.…
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique
Viveksharma Prabhakara, Daen Jannis, Armand Béché +2
Moiré fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another referen…
Spectroscopic coincidence experiments in transmission electron microscopy
Daen Jannis, Knut Müller-Caspary, Armand Béché +2
We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spect…