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physics.app-ph2019★ 12 cited
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique
Viveksharma Prabhakara, Daen Jannis, Armand Béché +2
Moiré fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another referen…
physics.ins-det2019★ 27 cited
Spectroscopic coincidence experiments in transmission electron microscopy
Daen Jannis, Knut Müller-Caspary, Armand Béché +2
We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spect…