99 citations · 255 across the 18 of their papers we have counts for
Showing 2020Show all
2 papers · 1 filter
physics.app-ph2020★ 4 cited
Wide field of view crystal orientation mapping of layered materials
A. Orekhov, D. Jannis, N. Gauquelin +10
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi-…
physics.app-ph2020★ 7 cited
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Viveksharma Prabhakara, Daen Jannis, Giulio Guzzinati +3
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors.…