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physics.ins-det2021★ 99 cited
Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications
Daen Jannis, Christoph Hofer, Chuang Gao +4
Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substant…
physics.ins-det2019★ 27 cited
Spectroscopic coincidence experiments in transmission electron microscopy
Daen Jannis, Knut Müller-Caspary, Armand Béché +2
We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spect…