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20182023
most citedDAMO: Deep Agile Mask Optimization for Full Chip Scale

31 citations · 89 across the 13 of their papers we have counts for

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Showing cs.LGShow all

7 papers · 1 filter

cs.LG2022★ 2 cited

An Adversarial Active Sampling-based Data Augmentation Framework for Manufacturable Chip Design

Mingjie Liu, Haoyu Yang, Zongyi Li +7

Lithography modeling is a crucial problem in chip design to ensure a chip design mask is manufacturable. It requires rigorous simulations of optical and chemical models that are co…

cs.LG2022★ 3 cited

Large Scale Mask Optimization Via Convolutional Fourier Neural Operator and Litho-Guided Self Training

Haoyu Yang, Zongyi Li, Kumara Sastry +5

Machine learning techniques have been extensively studied for mask optimization problems, aiming at better mask printability, shorter turnaround time, better mask manufacturability…

cs.LG2021★ 2 cited

Routing Towards Discriminative Power of Class Capsules

Haoyu Yang, Shuhe Li, Bei Yu

Capsule networks are recently proposed as an alternative to modern neural network architectures. Neurons are replaced with capsule units that represent specific features or entitie…

cs.LG2019

VLSI Mask Optimization: From Shallow To Deep Learning

Haoyu Yang, Wei Zhong, Yuzhe Ma +4

VLSI mask optimization is one of the most critical stages in manufacturability aware design, which is costly due to the complicated mask optimization and lithography simulation. Re…

cs.LG2019

Automatic Layout Generation with Applications in Machine Learning Engine Evaluation

Haoyu Yang, Wen Chen, Piyush Pathak +3

Machine learning-based lithography hotspot detection has been deeply studied recently, from varies feature extraction techniques to efficient learning models. It has been observed…

cs.LG2019★ 11 cited

Are Adversarial Perturbations a Showstopper for ML-Based CAD? A Case Study on CNN-Based Lithographic Hotspot Detection

Kang Liu, Haoyu Yang, Yuzhe Ma +5

There is substantial interest in the use of machine learning (ML) based techniques throughout the electronic computer-aided design (CAD) flow, particularly those based on deep lear…

cs.LG2018★ 5 cited

Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning

Haoyu Yang, Shuhe Li, Cyrus Tabery +2

Layout hotpot detection is one of the main steps in modern VLSI design. A typical hotspot detection flow is extremely time consuming due to the computationally expensive mask optim…