47 citations · 54 across the 5 of their papers we have counts for
7 papers
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks
Fernando Fernandes dos Santos, Angeliki Kritikakou, Josie Esteban Rodriguez Condia +4
The reliability evaluation of Deep Neural Networks (DNNs) executed on Graphic Processing Units (GPUs) is a challenging problem since the hardware architecture is highly complex and…
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections
Juan-David Guerrero-Balaguera, Luigi Galasso, Robert Limas Sierra +1
Currently, Deep learning and especially Convolutional Neural Networks (CNNs) have become a fundamental computational approach applied in a wide range of domains, including some saf…
A Novel Compaction Approach for SBST Test Programs
Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda
In-field test of processor-based devices is a must when considering safety-critical systems (e.g., in robotics, aerospace, and automotive applications). During in-field testing, di…
Exploring the Mysteries of System-Level Test
Ilia Polian, Jens Anders, Steffen Becker +7
System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in op…
New categories of Safe Faults in a processor-based Embedded System
C. C. Gursoy, M. Jenihhin, A. S. Oyeniran +4
The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its…
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda +15
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critic…