47 citations · 58 across the 9 of their papers we have counts for
3 papers · 1 filter
Comparing different solutions for testing resistive defects in low-power SRAMs
Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino +4
Low-power SRAM architectures are especially sensitive to many types of defects that may occur during manufacturing. Among these, resistive defects can appear. This paper analyzes s…
A Novel Compaction Approach for SBST Test Programs
Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda
In-field test of processor-based devices is a must when considering safety-critical systems (e.g., in robotics, aerospace, and automotive applications). During in-field testing, di…
Exploring the Mysteries of System-Level Test
Ilia Polian, Jens Anders, Steffen Becker +7
System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in op…