29 citations · 57 across the 3 of their papers we have counts for
4 papers
Fast versus conventional HAADF-STEM tomography: advantages and challenges
Hans Vanrompay, Alexander Skorikov, Eva Bladt +4
Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisi…
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Viveksharma Prabhakara, Daen Jannis, Giulio Guzzinati +3
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors.…
Spectroscopic coincidence experiments in transmission electron microscopy
Daen Jannis, Knut Müller-Caspary, Armand Béché +2
We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spect…
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping
Giulio Guzzinati, Wannes Ghielens, Christoph Mahr +4
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and pr…