29 citations · 57 across the 3 of their papers we have counts for
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Reducing electron beam damage through alternative STEM scanning strategies. Part II -- Attempt towards an empirical model describing the damage process
D. Jannis, A. Velazco, A. Béché +1
In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan…
Fast versus conventional HAADF-STEM tomography: advantages and challenges
Hans Vanrompay, Alexander Skorikov, Eva Bladt +4
Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisi…
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping
Giulio Guzzinati, Wannes Ghielens, Christoph Mahr +4
Strain has a strong effect on the properties of materials and the performance of electronic devices. Their ever shrinking size translates into a constant demand for accurate and pr…