369 citations · 714 across the 12 of their papers we have counts for
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cond-mat.mtrl-sci2020★ 1 cited
Fast versus conventional HAADF-STEM tomography: advantages and challenges
Hans Vanrompay, Alexander Skorikov, Eva Bladt +4
Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisi…
physics.app-ph2020★ 7 cited
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale
Viveksharma Prabhakara, Daen Jannis, Giulio Guzzinati +3
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors.…