activity
20182025
most citedCorryvreckan: A Modular 4D Track Reconstruction and Analysis Software for Test Beam Data

76 citations · 168 across the 7 of their papers we have counts for

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12 papers · 1 filter

physics.ins-det2025

Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process

Gianluca Aglieri Rinella, Nicole Apadula, Anton Andronic +55

The next generation of MAPS for future tracking detectors will have to meet stringent requirements placed on them. One such detector is the ALICE ITS3 that aims to be very light at…

physics.ins-det202211 cited

Transient Monte Carlo Simulations for the Optimisation and Characterisation of Monolithic Silicon Sensors

Rafael Ballabriga, Justus Braach, Eric Buschmann +12

An ever-increasing demand for high-performance silicon sensors requires complex sensor designs that are challenging to simulate and model. The combination of electrostatic finite e…

physics.ins-det2021

Test-beam characterisation of the CLICTD technology demonstrator - a small collection electrode High-Resistivity CMOS pixel sensor with simultaneous time and energy measurement

R. Ballabriga, E. Buschmann, M. Campbell +15

The CLIC Tracker Detector (CLICTD) is a monolithic pixel sensor. It is fabricated in a 180 nm CMOS imaging process, modified with an additional deep low-dose n-type implant to obta…

physics.ins-det202076 cited

Corryvreckan: A Modular 4D Track Reconstruction and Analysis Software for Test Beam Data

Dominik Dannheim, Katharina Dort, Lennart Huth +9

Corryvreckan is a versatile, highly configurable software with a modular structure designed to reconstruct and analyse test beam and laboratory data. It caters to the needs of the…

physics.ins-det20201 cited

CLICTD: A monolithic HR-CMOS sensor chip for the CLIC silicon tracker

I. Kremastiotis, R. Ballabriga, K. Dort +2

The CLIC Tracker Detector (CLICTD) is a monolithic pixelated sensor chip produced in a nm imaging CMOS process built on a high-resistivity epitaxial layer. The chip, designed…

physics.ins-det2020

Combining TCAD and Monte Carlo Methods to Simulate CMOS Pixel Sensors with a Small Collection Electrode using the Allpix Squared Framework

Dominik Dannheim, Katharina Dort, Daniel Hynds +4

Combining electrostatic field simulations with Monte Carlo methods enables realistic modeling of the detector response for novel monolithic silicon detectors with strongly non-line…