Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature
arXiv:cond-mat/0610408 · doi:10.1063/1.2436651
Abstract
We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed.
4 pages
References in corpus (3)
Cited by in corpus (7)
- Phase controlled superconducting proximity effect probed by tunneling spectroscopy
- Dynamics of quartz tuning fork force sensors used in scanning probe microscopy
- On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: successes and limitations
- Absence of edge reconstruction for quantum Hall edge channels in graphene devices
- Non-invasive nanoscale potentiometry and ballistic transport in epigraphene nanoribbons
- A Transimpedance Amplifier for Remotely Located Quartz Tuning Forks
- A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device