Low-temperature, high-resolution magnetic force microscopy using a quartz tuning fork
arXiv:cond-mat/0505022 · doi:10.1063/1.2037852
Abstract
We have developed a low temperature, high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300 N/m mounted with a commercial MFM cantilever tip was used. We have obtained high resolution images of the stray magnetic fields exerted from grains with a spatial resolution of 15 nm and force resolution of 2 pN at 4.2 K. Tuning fork based magnetic force microscopes have the potential to be used at millikelvin temperatures due to their low power dissipation and high force sensitivity.
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