A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device
arXiv:1209.5502 · doi:10.1063/1.4769258
Abstract
We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an individual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.
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- Implementing Microwave Impedance Microscopy in a Dilution Refrigerator
- Macroscopic-ranged proximity effect in graphite