Precipitation of amorphous ferromagnetic semiconductor phase in epitaxially grown Mn-doped Ge thin films
arXiv:cond-mat/0511361 · doi:10.1143/JJAP.44.L1426
Abstract
We investigated the origin of ferromagnetism in epitaxially grown Mn-doped Ge thin films. Using low-temperature molecular beam epitaxy, Mn-doped Ge films were successfully grown without precipitation of ferromagnetic Ge-Mn intermetallic compounds, such as Mn5Ge3. Magnetic circular dichroism measurements revealed that the epitaxially grown Mn-doped Ge films exhibited clear ferromagnetic behavior, but the Zeeman splitting observed at the critical points was not induced by the s,p-d exchange interactions. High-resolution transmission electron microscopy and energy dispersive X-ray spectroscopy analyses show phase separation of amorphous Ge1-xMnx clusters with high Mn content from a Mn-free monocrystalline Ge matrix. Since amorphous Ge1-xMnx was characterized as a homogeneous ferromagnetic semiconductor, the precipitation of the amorphous Ge1-xMnx clusters is the origin of the ferromagnetic semiconductor behavior of the epitaxially grown Mn-doped Ge films.
arXiv comment12pages, 4figures
References in corpus (2)
Cited by in corpus (5)
- Spinodal nanodecomposition in magnetically doped semiconductors
- Structure and magnetism of self-organized Ge(1-x)Mn(x) nano-columns
- Spin-glass-like behavior of Ge:Mn
- Magneto-optical properties of a new group-IV ferromagnetic semiconductor Ge1-xFex grown by low-temperature molecular beam epitaxy
- Strain and correlation of self-organized Ge_(1-x)Mn_x nanocolumns embedded in Ge (001)