Monolithic 4H-SiC nanomechanical resonators with high intrinsic quality factors

Abstract

We present an extensive study of 4H-SiC nanomechanical resonators electrochemically etched out of a monocrystalline wafer. Combining piezo-driven interferometric determination of the mechanical spectra with scanning-laser-Doppler vibrometry, an unambiguous assignment of resonance peaks to flexural and torsional modes is achieved. The investigation of multiple harmonic eigenmodes of singly and doubly clamped resonators with varying geometry allows for a comprehensive characterization. Excellent intrinsic mechanical quality factors up to $2\times 10^5$ are found at room temperature, approaching the thermoelastic limit at eigenfrquencies exceeding 10 MHz. Mechanical stress is essentially absent. Young's modulus in agreement with literature. These findings are robust under post-processing treatments, in particular atomic layer etching and high-temperature thermal annealing. The resulting on-chip high-quality mechanical resonators represent a valuable technological element for a broad range of applications. In particular, the monolithic architecture meets the requirements of spin-based photonic quantum technologies on the upcoming SiC platform.

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