Differential Magnetic Force Microscopy with a Switchable Tip
arXiv:2412.04165 · doi:10.1103/yky5-qcrk
Abstract
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local Kelvin potential. However, distinguishing magnetic forces from van der Waals forces typically requires two measurements with opposite tip magnetizations under otherwise identical measurement conditions. Here, we present an inverted magnetic force microscope where the sample is mounted on a flat cantilever for force sensing, and the magnetic tip is attached to a miniaturized electromagnet that periodically flips the tip magnetization. This setup enables the extraction of magnetic tip-sample interactions from the sidebands occurring at the switching rate in the cantilever oscillation spectrum. Our method achieves the separation of magnetic signals from other force contributions in a single-scan mode. Future iterations of this setup may incorporate membrane, trampoline, or string resonators with ultra-high quality factors, potentially improving measurement sensitivity by up to three orders of magnitude compared to the state-of-the-art MFM systems using cantilevers.
7 pages, 4 figures in Main and 3 pages, 3 figures in supplement
References in corpus (30)
- Heating of trapped ions from the quantum ground state
- Ion-trap measurements of electric-field noise near surfaces
- Experimental evidence for a surface distribution of two-level systems in superconducting lithographed microwave resonators
- On the surface paramagnetism of diamond
- Mechanics of Individual, Isolated Vortices in a Cuprate Superconductor
- Improving the Coherence Time of Superconducting Coplanar Resonators
- Force-detected nuclear magnetic resonance: Recent advances and future challenges
- Temperature Dependence of Electric Field Noise Above Gold Surfaces
- Individual skyrmion manipulation by local magnetic field gradients
- Controlled Manipulation of Individual Vortices in a Superconductor
- Nanomechanical detection of nuclear magnetic resonance using a silicon nanowire oscillator
- A microscopic model of electronic field noise heating in ion traps
- Ground State Cooling of an Ultracoherent Electromechanical System
- Membrane-based scanning force microscopy
- Magnetic Resonance Force Microscopy of paramagnetic electron spins at millikelvin temperatures
- Coexistence of distinct skyrmion phases observed in hybrid ferromagnetic/ferrimagnetic multilayers
- Ultrasensitive mechanical detection of magnetic moment using a commercial disk drive write head
- Electric-Field Noise above a Thin Dielectric Layer on Metal Electrodes
- Magnetic resonance force microscopy with a one-dimensional resolution of 0.9 nanometers
- Nanomechanical resonators with ultra-high- perimeter modes
- Non-contact Friction and Relaxational Dynamics of Surface Defects
- High-Resolution Nanoscale Solid-State Nuclear Magnetic Resonance Spectroscopy
- Roadmap on Nanoscale Magnetic Resonance Imaging
- Spin detection via parametric frequency conversion in a membrane resonator
- Spatially resolved surface dissipation over metal and dielectric substrates
- Spin-mediated dissipation and frequency shifts of a cantilever at milliKelvin temperatures
- Accelerated nanoscale magnetic resonance imaging through phase multiplexing
- Dry launching of silica nanoparticles in vacuum
- Nanometer-Scale Nuclear Magnetic Resonance Diffraction with Sub-Ångstrom Precision
- Enhancing Membrane-Based Scanning Force Microscopy Through an Optical Cavity