Twist angle dependent interlayer transfer of valley polarization from excitons to free charge carriers in WSe/MoSe heterobilayers
arXiv:2211.17210 · doi:10.1038/s41699-023-00420-1
Abstract
We identify an optical excitation mechanism that transfers a valley polarization from photo-excited electron-hole pairs to free charge carriers in twisted WSe/MoSe heterobilayers. For small twist angles, the valley lifetimes of the charge carriers are surprisingly short, despite the occurrence of interlayer excitons with their presumably long recombination and polarization lifetimes. For large twist angles, we measure an increase in both the valley polarization and its respective lifetime by more than two orders of magnitude. Interestingly, in such heterobilayers we observe an interlayer transfer of valley polarization from the WSe layer into the MoSe layer. This mechanism enables the creation of a photo-induced valley polarization of free charge carriers in MoSe, which amplitude scales with the gate-induced charge carrier density. This is in contrast to monolayer MoSe, where such a gate-tunable valley polarization cannot be achieved. By combining time-resolved Kerr rotation, photoluminesence and angle-resolved photoemission spectroscopy measurements with first principles calculations, we show that these findings can be explained by twist angle dependent interlayer scattering mechanisms involving the Q- and -valleys.
21 pages, 10 figures
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