Ion trap with gold-plated alumina: substrate and surface characterization

Abstract

We describe a complete development process of a segmented-blade linear ion trap. Alumina substrate is characterized with an X-ray diffraction and loss-tangent measurement. The blade is laser-micromachined and polished, followed by the sputtering and gold electroplating. Surface roughness is examined at each step of the fabrication via both electron and optical microscopies. On the gold-plated facet, we obtain a height deviation of tens of nanometers in the vicinity of the ion position. Trapping of laser-cooled ${}^{174}$Yb${}^{+}$ ions is demonstrated.

arXiv comment9 pages, 6 figures

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• Numerical investigation of a segmented-blade ion trap with biasing rods