Ion trap with gold-plated alumina: substrate and surface characterization
arXiv:2207.06878 · doi:10.1063/5.0112583
Abstract
We describe a complete development process of a segmented-blade linear ion trap. Alumina substrate is characterized with an X-ray diffraction and loss-tangent measurement. The blade is laser-micromachined and polished, followed by the sputtering and gold electroplating. Surface roughness is examined at each step of the fabrication via both electron and optical microscopies. On the gold-plated facet, we obtain a height deviation of tens of nanometers in the vicinity of the ion position. Trapping of laser-cooled Yb ions is demonstrated.
9 pages, 6 figures
References in corpus (13)
- Supplementary information for "Quantum supremacy using a programmable superconducting processor"
- Strong quantum computational advantage using a superconducting quantum processor
- An Al quantum-logic clock with systematic uncertainty below
- A microfabricated surface-electrode ion trap for scalable quantum information processing
- Quantum harmonic oscillator state synthesis by reservoir engineering
- Suppression of Heating Rates in Cryogenic Surface-Electrode Ion Traps
- T-junction ion trap array for two-dimensional ion shuttling, storage and manipulation
- Scalable creation of long-lived multipartite entanglement
- Ion traps fabricated in a CMOS foundry
- Cryogenic silicon surface ion trap
- Industrially Microfabricated Ion Trap with 1 eV Trap Depth
- Ion trap architectures and new directions
- Locking Multi-laser Frequencies to a Precision Wavelength Meter: Application to Cold Atoms