Imaging current paths in silicon photovoltaic devices with a quantum diamond microscope
arXiv:2203.12115 · doi:10.1103/PhysRevApplied.18.014041
Abstract
Magnetic imaging with nitrogen-vacancy centers in diamond, also known as quantum diamond microscopy, has emerged as a useful technique for the spatial mapping of charge currents in solid-state devices. In this work, we investigate an application to photovoltaic (PV) devices, where the currents are induced by light. We develop a widefield nitrogen-vacancy microscope that allows independent stimulus and measurement of the PV device, and test our system on a range of prototype crystalline silicon PV devices. We first demonstrate micrometer-scale vector magnetic field imaging of custom PV devices illuminated by a focused laser spot, revealing the internal current paths in both short-circuit and open-circuit conditions. We then demonstrate time-resolved imaging of photocurrents in an interdigitated back-contact solar cell, detecting current build-up and subsequent decay near the illumination point with microsecond resolution. This work presents a versatile and accessible analysis platform that may find distinct application in research on emerging PV technologies.
14 pages, 9 figures
References in corpus (4)
- Magnetic Field Fingerprinting of Integrated Circuit Activity with a Quantum Diamond Microscope
- Improved current density and magnetisation reconstruction through vector magnetic field measurements
- Measurement and Simulation of the Magnetic Fields from a 555 Timer Integrated Circuit using a Quantum Diamond Microscope and Finite Element Analysis
- An Integrated Widefield Probe for Practical Diamond Nitrogen-Vacancy Microscopy
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