Giant modulation of the electron mobility in semiconductor BiOSe via incipient ferroelectric phase transition
arXiv:2108.03904 · doi:10.1021/jacs.1c12681
Abstract
High-mobility layered semiconductors have the potential to enable the next-generation electronics and computing. This paper demonstrates that the ultrahigh electron mobility observed in the layered semiconductor BiOSe originates from an incipient ferroelectric transition that endows the material with a robust protection against mobility degradation by Coulomb scattering. Based on first-principles calculations of electron-phonon interaction and ionized impurity scattering, it is shown that the electron mobility of BiOSe can reach 10 to 10 cmVs over a wide range of realistic doping concentrations. Furthermore, a small elastic strain of 1.7% can drive the material toward a unique interlayer ferroelectric transition, resulting in a large increase in the dielectric permittivity and a giant enhancement of the low-temperature electron mobility by more than an order of magnitude. These results establish a new route to realize high-mobility layered semiconductors via phase and dielectric engineering.
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Cited by in corpus (5)
- Achieving ferroelectricity in a centrosymmetric high-performance semiconductor by strain engineering
- Polar discontinuities and interfacial electronic properties of BiOSe on SrTiO
- Highly Polarizable Semiconductors and Universal Origin of Ferroelectricity in Materials with a Litharge-Type Structural Unit
- Phonon properties and unconventional heat transfer in quasi-2D crystal
- The Influence of Electric Field on the Anisotropic Dispersion of the Flexocoupling Induced Phonons and Ferrons in Van der Waals Ferrielectrics