High-fidelity single-shot readout of single electron spin in diamond with spin-to-charge conversion

Abstract

High fidelity single-shot readout of qubits is a crucial component for fault-tolerant quantum computing and scalable quantum networks. In recent years, the nitrogen-vacancy (NV) center in diamond has risen as a leading platform for the above applications. The current single-shot readout of the NV electron spin relies on resonance fluorescence method at cryogenic temperature. However, the the spin-flip process interrupts the optical cycling transition, therefore, limits the readout fidelity. Here, we introduce a spin-to-charge conversion method assisted by near-infrared (NIR) light to suppress the spin-flip error. This method leverages high spin-selectivity of cryogenic resonance excitation and high flexibility of photonionization. We achieve an overall fidelity $>$ 95% for the single-shot readout of an NV center electron spin in the presence of high strain and fast spin-flip process. With further improvements, this technique has the potential to achieve spin readout fidelity exceeding the fault-tolerant threshold, and may also find applications on integrated optoelectronic devices.

References in corpus (7)

• High-fidelity projective readout of a solid-state spin quantum register
• Unconditional quantum teleportation between distant solid-state qubits
• Efficient readout of a single spin state in diamond via spin-to-charge conversion
• Robust All-Optical Single-Shot Readout of NV Centers in Diamond
• Single DNA Electron Spin Resonance Spectroscopy in Aqueous Solutions
• Ultrafast electronic read-out of diamond NV centers coupled to graphene
• Efficient electrical spin readout of NV- centers in diamond

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