Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
arXiv:2008.12768 · doi:10.1103/PhysRevResearch.3.023159
Abstract
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailability of wavefront shaping optics, and the highly nonlinear inversion required from intensity-only measurements. In this work, we present a new algorithm using the scattering matrix formalism to solve the scattering from a non-crystalline medium from scanning diffraction measurements, and recover the illumination aberrations. Our method will enable 3D imaging and materials characterization at high resolution for a wide range of materials.
References in corpus (14)
- Measuring the Transmission Matrix in Optics : An Approach to the Study and Control of Light Propagation in Disordered Media
- Light fields in complex media: mesoscopic scattering meets wave control
- High-resolution 3D refractive index microscopy of multiple-scattering samples from intensity images
- Reference-less measurement of the transmission matrix of a highly scattering material using a DMD and phase retrieval techniques
- Potential of attosecond coherent diffractive imaging
- Toward Moiré engineering in 2D materials via dislocation theory
- Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization
- Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe
- Three dimensions, two microscopes, one code: automatic differentiation for x-ray nanotomography beyond the depth of focus limit
- Layer-Dependent Topological Phase in a Two-Dimensional Quasicrystal and Approximant
- A uniqueness result for propagation-based phase contrast imaging from a single measurement
- Intensity-only optical compressive imaging using a multiply scattering material and a double phase retrieval approach
- A ray-trace analysis of X-ray multilayer Laue lenses for nanometer focusing
- A linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering