2 papers
cond-mat.mtrl-sci2019
A linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering
Hamish G. Brown, Jim Ciston, Colin Ophus
Strong multiple scattering of the probe in scanning transmission electron microscopy (STEM) means image simulations are usually required for quantitative interpretation and analysi…
cond-mat.mtrl-sci2018
Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe
Hamish G. Brown, Zhen Chen, Matthew Weyland +4
The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new…