352 citations · 785 across the 14 of their papers we have counts for
14 papers
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Marcel Schloz, Thomas C. Pekin, Hamish G. Brown +9
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series…
Differential phase contrast from electrons that cause inner shell ionization
Michael Deimetry, Timothy C. Petersen, Hamish G. Brown +2
Differential Phase Contrast (DPC) imaging, in which deviations in the bright field beam are in proportion to the electric field, has been extensively studied in the context of pure…
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Peter Ercius, Ian J. Johnson, Philipp Pelz +19
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 8…
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model
Steven E Zeltmann, Shang-Lin Hsu, Hamish G Brown +4
Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each dif…
Fast unified reconstruction algorithm for conventional, phase-contrast and diffraction tomography
Timur E. Gureyev, Hamish G. Brown, Harry M. Quiney +1
A unified method for three-dimensional reconstruction of objects from transmission images collected at multiple illumination directions is described. The method may be applicable t…
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector
T. Mawson, D. J. Taplin, H. G. Brown +10
Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors…
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography
T. E. Gureyev, H. M. Quiney, A. Kozlov +3
It has been argued that in atomic-resolution transmission electron microscopy (TEM) of sparse weakly scattering structures, such as small biological molecules, multiple electron sc…
A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data
Hamish G. Brown, Philipp M. Pelz, Shang-Lin Hsu +13
Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present…
Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Philipp M Pelz, Hamish G Brown, Jim Ciston +4
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailabil…
Strain fields in twisted bilayer graphene
Nathanael P. Kazmierczak, Madeline Van Winkle, Colin Ophus +7
Van der Waals heteroepitaxy allows deterministic control over lattice mismatch or azimuthal orientation between atomic layers to produce long wavelength superlattices. The resultin…
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann +18
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-spee…
A linear-scaling algorithm for rapid computation of inelastic transitions in the presence of multiple electron scattering
Hamish G. Brown, Jim Ciston, Colin Ophus
Strong multiple scattering of the probe in scanning transmission electron microscopy (STEM) means image simulations are usually required for quantitative interpretation and analysi…
Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe
Hamish G. Brown, Zhen Chen, Matthew Weyland +4
The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new…
Probing the limits of the rigid-intensity-shift model in differential phase contrast scanning transmission electron microscopy
L. Clark, H. G. Brown, D. M. Paganin +5
The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by…