352 citations · 528 across the 12 of their papers we have counts for
12 papers
The BiP-PRISM algorithm for fast and scalable core-loss STEM-EELS simulations
Philipp Pelz
Quantitative interpretation of atomic-resolution STEM-EELS requires dynamical simulation of the electron probe before and after core-loss transitions, which is computationally expe…
High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography
Andrey Romanov, Min Gee Cho, Mary Cooper Scott +2
Resolving single atoms in large-scale volumes has been a goal for atomic resolution microscopy for a long time. Electron microscopy has come close to this goal using a combination…
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Peter Ercius, Ian J. Johnson, Philipp Pelz +19
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 8…
Imaging the electron charge density in monolayer MoS2 at the Ångstrom scale
Joel Martis, Sandhya Susarla, Archith Rayabharam +15
Four-dimensional scanning transmission electron microscopy (4D-STEM) has recently gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom spat…
Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography
Philipp M Pelz, Sinead Griffin, Scott Stonemeyer +6
Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials scienc…
Simultaneous Successive Twinning Captured by Atomic Electron Tomography
Phillip M. Pelz, Catherine K. Groschner, Alexandra Bruefach +3
Shape-controlled synthesis of multiply twinned nanostructures is heavily emphasized in nanoscience, in large part due to the desire to control the size, shape, and terminating face…
Real-time interactive 4D-STEM phase-contrast imaging from electron event representation data
Philipp M. Pelz, Ian Johnson, Colin Ophus +2
The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require…
A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations
Philipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta +3
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with…
Scalable multicomponent spectral analysis for high-throughput data annotation
Rui Patrick Xian, Ralph Ernstorfer, Philipp Michael Pelz
Orchestrating parametric fitting of multicomponent spectra at scale is an essential yet underappreciated task in high-throughput quantification of materials and chemical compositio…
A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data
Hamish G. Brown, Philipp M. Pelz, Shang-Lin Hsu +13
Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present…
Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone
Philipp M Pelz, Hamish G Brown, Jim Ciston +4
Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely challenging, due to small numerical apertures, the unavailabil…
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann +18
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-spee…