Counting statistics and microreversibility in stochastic models of transistors

Abstract

Multivariate fluctuation relations are established in three stochastic models of transistors, which are electronic devices with three ports and thus two coupled currents. In the first model, the transistor has no internal state variable and particle exchanges between the ports is described as a Markov jump process with constant rates. In the second model, the rates linearly depend on an internal random variable, representing the occupancy of the transistor by charge carriers. The third model has rates nonlinearly depending on the internal occupancy. For the first and second models, finite-time multivariate fluctuation relations are also established giving insight into the convergence towards the asymptotic form of multivariate fluctuation relations in the long-time limit. For all the three models, the transport properties are shown to satisfy Onsager's reciprocal relations in the linear regime close to equilibrium as well as their generalizations holding in the nonlinear regimes farther away from equilibrium, as a consequence of microreversibility.

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• Tensor-Network Approaches to Counting Statistics for the Current in a Boundary-Driven Diffusive System
• Full Counting Statistics and Fluctuation Theorem for the Currents in the Discrete Model of Feynman's Ratchet
• Optimal control of bit erasure in stochastic random access memory