Microreversibility, fluctuations, and nonlinear transport in transistors

Abstract

We present a stochastic approach for charge transport in transistors. In this approach, the electron and hole densities are governed by diffusion-reaction stochastic differential equations satisfying local detailed balance and the electric field is determined with the Poisson equation. The approach is consistent with the laws of electricity, thermodynamics, and microreversibility. In this way, the signal amplifying effect of transistors is verified under their working conditions. We also perform the full counting statistics of the two electric currents coupled together in transistors and we show that the fluctuation theorem holds for their joint probability distribution. Similar results are obtained including the displacement currents. In addition, the Onsager reciprocal relations and their generalizations to nonlinear transport properties deduced from the fluctuation theorem are numerically shown to be satisfied.

References in corpus (6)

• Nonequilibrium fluctuations in a resistor
• Symmetries in Fluctuations Far from Equilibrium
• Fluctuations of the total entropy production in stochastic systems
• Microreversibility, nonequilibrium current fluctuations, and response theory
• Stochastic approach and fluctuation theorem for charge transport in diodes
• Finite-time fluctuation theorem for diffusion-influenced surface reactions on spherical and Janus catalytic particles

Cited by in corpus (9)

• Stochastic Thermodynamics of Non-Linear Electronic Circuits: A Realistic Framework for Computing around kT
• Principles of Low Dissipation Computing from a Stochastic Circuit Model
• Thermodynamic Computing via Autonomous Quantum Thermal Machines
• Reliability and entropy production in non-equilibrium electronic memories
• Counting statistics and microreversibility in stochastic models of transistors
• Stochastic Impedance
• Microreversibility and quantum transport in Aharonov-Bohm rings
• Tensor-Network Approaches to Counting Statistics for the Current in a Boundary-Driven Diffusive System
• Full Counting Statistics and Fluctuation Theorem for the Currents in the Discrete Model of Feynman's Ratchet