Interface Dark Excitons at Sharp Lateral Two-Dimensional Heterostructures
arXiv:2004.01381 · doi:10.1088/1402-4896/abe494
Abstract
We study the dark excitons at the interface of sharp lateral heterostructure of two-dimensional transition metal dichalcogenides. By introducing a low-energy effective Hamiltonian model, we find the energy dispersion relation of exciton and show how it depends on the onsite energy of composed materials and their spin-orbit coupling strengths. It is shown that the effect of geometrical structure of interface, as a deformation gauge field (pseudo-spin-orbit coupling), should be considered in calculating the binding energy of exciton. By discretization of real-space version of the dispersion relation on a triangular lattice, we show that the binding energy of exciton depends on its distance from the interface line. For exciton near the interface the binding energy is equal to 0.36 eV, while for the exciton enough far from the interface it is equal to 0.26 eV. Also, it has been shown that for zigzag interface the binding energy increases by 0.34 meV in comparison with the armchair interface due to the pseudo-spin-orbit interaction (gauge filed). The results can be used for designing the two-dimensional lateral heterostructure based optoelectronic devices and improving their characteristics.
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