Electrostatics of Two-Dimensional Lateral Junctions
arXiv:1802.04635 · doi:10.1088/1361-6528/aabeb2
Abstract
The increasing technological control of two-dimensional materials has allowed the demonstration of 2D lateral junctions, which display unique properties that might serve as the basis for a new generation of 2D electronic and optoelectronic devices. Notably, the chemically doped MoS homojunction, the WSe-MoS monolayer and MoS monolayer/multilayer heterojunctions, have been demonstrated. Here we report the investigation of 2D lateral junction electrostatics, which differs from the bulk case because of the weaker screening, producing a much longer transition region between the space charge region and the quasi-neutral region, making inappropriate the use of the complete-depletion approximation. For such a purpose we have developed a method based on the conformal mapping technique to solve the 2D electrostatics, which is widely applicable to every kind of junctions, giving accurate results for even large asymmetric charge distribution scenarios.
8 pages. 7 figures, Supplementary material
References in corpus (4)
Cited by in corpus (5)
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- Gate Tunable Lateral 2D pn Junctions: An Analytical Study of Its Electrostatics
- The gate tunable 2D pn junction driven out-of-equilibrium
- Interface Dark Excitons at Sharp Lateral Two-Dimensional Heterostructures