Imaging Andreev Reflection in Graphene

Abstract

Coherent charge transport along ballistic paths can be introduced into graphene by Andreev reflection, for which an electron reflects from a superconducting contact as a hole, while a Cooper pair is transmitted. We use a liquid-helium cooled scanning gate microscope (SGM) to image Andreev reflection in graphene in the magnetic focusing regime, where carriers move along cyclotron orbits between contacts. Images of flow are obtained by deflecting carrier paths and displaying the resulting change in conductance. When electrons enter the the superconductor, Andreev-reflected holes leave for the collecting contact. To test the results, we destroy Andreev reflection with a large current and by heating above the critical temperature. In both cases, the reflected carriers change from holes to electrons.

14 pages, 4 figures

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• Scanning gate microscopy of nonretracing electron-hole trajectories in a normal-superconductor junction
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• Supercurrent modulation in InSb nanoflag-based Josephson junctions by scanning gate microscopy
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• Imaging chiral Andreev reflection in the presence of Rashba spin-orbit coupling