Characterization and Analysis of On-Chip Microwave Passive Components at Cryogenic Temperatures

Abstract

This paper presents the characterization of microwave passive components, including metal-oxide-metal (MoM) capacitors, transformers, and resonators, at deep cryogenic temperature (4.2 K). The variations in capacitance, inductance and quality factor are explained in relation to the temperature dependence of the physical parameters and the resulting insights on modeling of passives at cryogenic temperatures are provided. Both characterization and modeling, reported for the first time down to 4.2 K, are essential in designing cryogenic CMOS radio-frequency integrated circuits, a promising candidate to build the electronic interface for scalable quantum computers.

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Cited by in corpus (6)

• CMOS-based cryogenic control of silicon quantum circuits
• Scaling silicon-based quantum computing using CMOS technology: State-of-the-art, Challenges and Perspectives
• Spiderweb array: A sparse spin-qubit array
• Superconducting routing platform for large-scale integration of quantum technologies
• CMOS Quantum Computing: Toward A Quantum Computer System-on-Chip
• Cryogenic Multiplexing Control Chip for Superconducting Quantum Processor