Deep-Learning-Enabled Fast Optical Identification and Characterization of Two-Dimensional Materials

Abstract

Advanced microscopy and/or spectroscopy tools play indispensable role in nanoscience and nanotechnology research, as it provides rich information about the growth mechanism, chemical compositions, crystallography, and other important physical and chemical properties. However, the interpretation of imaging data heavily relies on the "intuition" of experienced researchers. As a result, many of the deep graphical features obtained through these tools are often unused because of difficulties in processing the data and finding the correlations. Such challenges can be well addressed by deep learning. In this work, we use the optical characterization of two-dimensional (2D) materials as a case study, and demonstrate a neural-network-based algorithm for the material and thickness identification of exfoliated 2D materials with high prediction accuracy and real-time processing capability. Further analysis shows that the trained network can extract deep graphical features such as contrast, color, edges, shapes, segment sizes and their distributions, based on which we develop an ensemble approach topredict the most relevant physical properties of 2D materials. Finally, a transfer learning technique is applied to adapt the pretrained network to other applications such as identifying layer numbers of a new 2D material, or materials produced by a different synthetic approach. Our artificial-intelligence-based material characterization approach is a powerful tool that would speed up the preparation, initial characterization of 2D materials and other nanomaterials and potentially accelerate new material discoveries.

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• Quantum Optics Applications of Hexagonal Boron Nitride Defects
• Machine learning spectral indicators of topology
• An open-source robust machine learning platform for real-time detection and classification of 2D material flakes
• Machine-learning accelerated identification of exfoliable two-dimensional materials
• Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning
• Quantitative analysis of MoS${}_2$ thin film micrographs with machine learning
• MaskTerial: A Foundation Model for Automated 2D Material Flake Detection