Systematic Investigation of Anisotropic Magneto-Peltier Effect and Anomalous Ettingshausen Effect in Ni Thin Films

Abstract

The anisotropic magneto-Peltier effect (AMPE) and anomalous Ettingshausen effect (AEE) have been investigated in U-shaped Ni thin films of varying thickness and substrate by means of the lock-in thermography (LIT) method. We have established a procedure to extract pure AMPE and AEE contributions, separated from other thermoelectric effects, for ferromagnetic thin films. The measurements of the magnetic-field-angle ${\theta }_{\mathrm{H}}$ dependence of the LIT images clearly show that the temperature modulation induced by the AMPE (AEE) in the Ni films varies with the $\cos 2{\theta }_{\mathrm{H}}$ ($\cos {\theta }_{\mathrm{H}}$) pattern, confirming the symmetry of the AMPE (AEE). The systematic LIT measurements using various substrates show that the AMPE-induced temperature modulation decreases with the increase in thermal conductivity of the substrates, whereas the AEE-induced temperature modulation is almost independent of the thermal conductivity, indicating that the heat loss into the substrates plays an important role in determining the magnitude of the AMPE-induced temperature modulation in thin films. Our experimental results were reproduced by numerical calculations based on a two-dimensional finite element method. These findings provide a platform for investigating the AMPE and AEE in thin film devices.

21 pages, 7 figures, 1 table (An error in Fig. 3 is corrected in v4)

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• Permanent-magnet-based transverse thermoelectric generator with high fill factor driven by anomalous Nernst effect
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• Anomalous Lorenz number in massive and tilted Dirac systems
• Deposition temperature dependence of thermo-spin and magneto-thermoelectric conversion in Co${}_2$MnGa films on Y${}_3$Fe${}_5$O${}_{12}$ and Gd${}_3$Ga${}_5$O${}_{12}$