Electronic transport through defective semiconducting carbon nanotubes
arXiv:1806.02737 · doi:10.1088/2399-6528/aae4cb
Abstract
We investigate the electronic transport properties of semiconducting (,) carbon nanotubes (CNTs) on the mesoscopic length scale with arbitrarily distributed realistic defects. The study is done by performing quantum transport calculations based on recursive Green's function techniques and an underlying density-functional-based tight-binding model for the description of the electronic structure. Zigzag CNTs as well as chiral CNTs of different diameter are considered. Different defects are exemplarily represented by monovacancies and divacancies. We show the energy-dependent transmission and the temperature-dependent conductance as a function of the number of defects. In the limit of many defetcs, the transport is described by strong localization. Corresponding localization lengths are calculated (energy dependent and temperature dependent) and systematically compared for a large number of CNTs. It is shown, that a distinction by has to be drawn in order to classify CNTs with different bandgaps. Besides this, the localization length for a given defect probability per unit cell depends linearly on the CNT diameter, but not on the CNT chirality. Finally, elastic mean free paths in the diffusive regime are computed for the limit of few defects, yielding qualitatively same statements.
References in corpus (16)
- The SIESTA method for ab initio order-N materials simulation
- Efficient index handling of multidimensional periodic boundary conditions
- Density functional method for nonequilibrium electron transport
- Random-Matrix Theory of Quantum Transport
- High Performance N-Type Carbon Nanotube Field Effect Transistors with Chemically Doped Contacts
- Tuning the conductance of single-walled carbon nanotubes by ion irradiation in the Anderson localization regime
- Electron-phonon effects and transport in carbon nanotubes
- Role of Single Defects in Electronic Transport through Carbon Nanotube Field-Effect Transistors
- Scaling theory put into practice: first-principles modeling of transport in doped silicon nanowires
- Anderson localization in carbon nanotubes: defect density and temperature effects
- Ab initio study of transport properties in defected carbon nanotubes: an O(N) approach
- Electronic transport in metallic carbon nanotubes with mixed defects within the strong localization regime
- Improved recursive Green's function formalism for quasi one-dimensional systems with realistic defects
- Strong localization in defective carbon nanotubes: a recursive Green's function study
- Electronic Transport Properties of Chemically Modified Double-Walled Carbon Nanotubes
- Empirical transport model of strained CNT transistors used for sensor applications