Intrinsic Origin of Enhancement of Ferroelectricity in SnTe Ultrathin Films

Abstract

Previous studies showed that, as ferroelectric films become thinner, their Curie temperature (Tc) and polarization below Tc both typically decrease. In contrast, a recent experiment [Chang et al., Science 353, 274 (2016)] observed that atomic-thick SnTe films have a higher Tc than their bulk counterpart, which was attributed to extrinsic effects. Here, we find, using first-principles calculations, that the 0K energy barrier for the polarization switching (which is a quantity directly related to Tc) is higher in most investigated defect-free SnTe ultrathin films than that in bulk SnTe, and that the 5-unit-cell (UC) SnTe thin film has the largest energy barrier as a result of an interplay between hybridization interactions and Pauli repulsions. Further simulations, employing a presently developed effective Hamiltonian, confirm that free-standing defect-free SnTe thin films have a higher Tc than bulk SnTe, except for the 1-UC case. Our work therefore demonstrates the possibility to intrinsically enhance ferroelectricity of ultrathin films by reducing their thickness.

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