Signature of surface state coupling in thin films of the topological Kondo insulator SmB from anisotropic magnetoresistance
arXiv:1612.00399 · doi:10.1103/PhysRevB.95.085112
Abstract
The temperature and thickness dependencies of the in-plane anisotropic magnetoresistance (AMR) of SmB thin films are reported. We find that the AMR changes sign from negative () at high temperatures to positive () at low temperatures. The temperature, T, at which this sign change occurs, decreases with increasing film thickness and T vanishes for 30 nm. We interpret our results in the framework of a competition between two components: a negative bulk contribution and a positive surface AMR.
8 pages, 11 figures
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Cited by in corpus (4)
- Planar Hall effect with sixfold oscillations in a Dirac antiperovskite
- Surface-induced positive planar Hall effect in topological Kondo insulator SmB6 microribbons
- Electrical properties of SmB thin films prepared by pulsed laser deposition from a stoichiometric SmB target
- Low temperature resistivity studies of SmB6: Observation of twodimensional variable-range hopping conductivity