Probing the Nuclear Spin-Lattice Relaxation Time at the Nanoscale
arXiv:1603.04238 · doi:10.1103/PhysRevApplied.6.014007
Abstract
Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice relaxation times locally at very low temperatures opens up the possibility to measure the magnetic properties of inhomogeneous electron systems realized in oxide interfaces, topological insulators and other strongly correlated electron systems such as high-Tc superconductors.
We revised the manuscript by including the supplemental material. The manuscript is changed from a Letter to a Research Article after change of journal
References in corpus (8)
- Complexity in Strongly Correlated Electronic Systems
- Locally enhanced conductivity due to the tetragonal domain structure in LaAlO/SrTiO heterointerfaces
- Phase separation from electron confinement at oxide interfaces
- Magnetic Resonance Force Microscopy of paramagnetic electron spins at millikelvin temperatures
- NMR Probe of Metallic States in Nanoscale Topological Insulators
- Nuclear magnetic resonance force microscopy with a microwire rf source
- Spin-mediated dissipation and frequency shifts of a cantilever at milliKelvin temperatures
- Probing the magnetic moment of FePt micromagnets prepared by Focused Ion Beam milling
Cited by in corpus (6)
- Vibration isolation with high thermal conductance for a cryogen-free dilution refrigerator
- A method for mechanical generation of radio frequency fields in nuclear magnetic resonance force microscopy
- Feasibility of imaging using Boltzmann polarization in nuclear Magnetic Resonance Force Microscopy
- Flux compensation for SQUID-detected Magnetic Resonance Force Microscopy
- mrfmsim: A modular, extendable, and readable simulation package for magnetic resonance force microscopy experiments
- Electrostatic transfer of sub-micron magnetic particles onto cantilevers using a focused ion beam system