75 citations · 285 across the 11 of their papers we have counts for
11 papers
Observation of flat moiré bands in twisted bilayer WSe
Gianmarco Gatti, Julia Issing, Louk Rademaker +16
The recent observation of correlated phases in transition metal dichalcogenide moiré systems at integer and fractional filling promises new insight into metal-insulator transitions…
Stacking domain morphology in epitaxial graphene on silicon carbide
Tobias A. de Jong, Luuk Visser, Johannes Jobst +2
Terrace-sized, single-orientation graphene can be grown on top of a carbon buffer layer on silicon carbide by thermal decomposition. Despite its homogeneous appearance, a surprisin…
Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
Tobias A. de Jong, Xingchen Chen, Johannes Jobst +3
Stacking domain boundaries occur in Van der Waals heterostacks whenever there is a twist angle or lattice mismatch between subsequent layers. Not only can these domain boundaries h…
Imaging moiré deformation and dynamics in twisted bilayer graphene
Tobias A. de Jong, Tjerk Benschop, Xingchen Chen +5
In twisted bilayer graphene (TBG) a moiré pattern forms that introduces a new length scale to the material. At the 'magic' twist angle of 1.1°, this causes a flat band to form, yie…
Measuring local moiré lattice heterogeneity of twisted bilayer graphene
Tjerk Benschop, Tobias A. de Jong, Petr Stepanov +5
We introduce a new method to continuously map inhomogeneities of a moiré lattice and apply it to large-area topographic images we measure on open-device twisted bilayer graphene (T…
Direct evidence for flat bands in twisted bilayer graphene from nano-ARPES
Simone Lisi, Xiaobo Lu, Tjerk Benschop +21
Transport experiments in twisted bilayer graphene revealed multiple superconducting domes separated by correlated insulating states. These properties are generally associated with…
Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis
Tobias A. de Jong, David N. L. Kok, Alexander J. H. van der Torren +4
For many complex materials systems, low-energy electron microscopy (LEEM) offers detailed insights into morphology and crystallography by naturally combining real-space and recipro…
Resistive evolution of toroidal field configurations and their relation to magnetic clouds
Christopher B. Smiet, Hugo J. de Blank, Tobias A. de Jong +2
We study the resistive evolution of a localized self-organizing magnetohydrodynamic equilibrium. In this configuration the magnetic forces are balanced by a pressure force caused b…
Stacking domains in graphene on silicon carbide: a pathway for intercalation
T. A. de Jong, E. E. Krasovskii, C. Ott +3
Graphene on silicon carbide (SiC) bears great potential for future graphene electronic applications because it is available on the wafer-scale and its properties can be custom-tail…
Measuring the Local Twist Angle and Layer Arrangement in Van der Waals Heterostructures
Tobias A. de Jong, Johannes Jobst, Hyobin Yoo +3
The properties of Van der Waals heterostructures are determined by the twist angle and the interface between adjacent layers as well as their polytype and stacking. Here we describ…
Probing the Nuclear Spin-Lattice Relaxation Time at the Nanoscale
J. J. T. Wagenaar, A. M. J. den Haan, J. M. de Voogd +9
Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by c…