activity
20182020
collaborators

6 papers

cond-mat.mes-hall2020

Measuring local moiré lattice heterogeneity of twisted bilayer graphene

Tjerk Benschop, Tobias A. de Jong, Petr Stepanov +5

We introduce a new method to continuously map inhomogeneities of a moiré lattice and apply it to large-area topographic images we measure on open-device twisted bilayer graphene (T…

cond-mat.str-el2020

Direct evidence for flat bands in twisted bilayer graphene from nano-ARPES

Simone Lisi, Xiaobo Lu, Tjerk Benschop +21

Transport experiments in twisted bilayer graphene revealed multiple superconducting domes separated by correlated insulating states. These properties are generally associated with…

cond-mat.mtrl-sci2019

Quantitative analysis of spectroscopic Low Energy Electron Microscopy data: High-dynamic range imaging, drift correction and cluster analysis

Tobias A. de Jong, David N. L. Kok, Alexander J. H. van der Torren +4

For many complex materials systems, low-energy electron microscopy (LEEM) offers detailed insights into morphology and crystallography by naturally combining real-space and recipro…

physics.plasm-ph2018

Resistive evolution of toroidal field configurations and their relation to magnetic clouds

Christopher B. Smiet, Hugo J. de Blank, Tobias A. de Jong +2

We study the resistive evolution of a localized self-organizing magnetohydrodynamic equilibrium. In this configuration the magnetic forces are balanced by a pressure force caused b…

cond-mat.mtrl-sci2018

Stacking domains in graphene on silicon carbide: a pathway for intercalation

T. A. de Jong, E. E. Krasovskii, C. Ott +3

Graphene on silicon carbide (SiC) bears great potential for future graphene electronic applications because it is available on the wafer-scale and its properties can be custom-tail…

cond-mat.mtrl-sci2018

Measuring the Local Twist Angle and Layer Arrangement in Van der Waals Heterostructures

Tobias A. de Jong, Johannes Jobst, Hyobin Yoo +3

The properties of Van der Waals heterostructures are determined by the twist angle and the interface between adjacent layers as well as their polytype and stacking. Here we describ…