Double resonance Raman modes in mono- and few-layer MoTe
arXiv:1501.07078 · doi:10.1103/PhysRevB.91.205415
Abstract
We study the second-order Raman process of mono- and few-layer MoTe, by combining {\em ab initio} density functional perturbation calculations with experimental Raman spectroscopy using 532, 633 and 785 nm excitation lasers. The calculated electronic band structure and the density of states show that the electron-photon resonance process occurs at the high-symmetry M point in the Brillouin zone, where a strong optical absorption occurs by a logarithmic Van-Hove singularity. Double resonance Raman scattering with inter-valley electron-phonon coupling connects two of the three inequivalent M points in the Brillouin zone, giving rise to second-order Raman peaks due to the M point phonons. The predicted frequencies of the second-order Raman peaks agree with the observed peak positions that cannot be assigned in terms of a first-order process. Our study attempts to supply a basic understanding of the second-order Raman process occurring in transition metal di-chalcogenides (TMDs) and may provide additional information both on the lattice dynamics and optical processes especially for TMDs with small energy band gaps such as MoTe or at high laser excitation energy.
10 pages, 5 figures
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Cited by in corpus (5)
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- Quantum interference effects in resonant Raman spectroscopy of single- and triple-layer MoTe from first principles
- Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy
- Pressure-dependent Semiconductor to Semimetal and Lifshitz transitions in 2H-MoTe: Raman and First-principles studies
- Metal-Insulator Transition and Emergent Gapped Phase in the Surface-Doped 2D Semiconductor 2H-MoTe