Measurement of Ion Motional Heating Rates over a Range of Trap Frequencies and Temperatures

Abstract

We present measurements of the motional heating rate of a trapped ion at different trap frequencies and temperatures between $\sim$0.6 and 1.5 MHz and $\sim$4 and 295 K. Additionally, we examine the possible effect of adsorbed surface contaminants with boiling points below $\sim$105${}^{\circ }$C by measuring the ion heating rate before and after locally baking our ion trap chip under ultrahigh vacuum conditions. We compare the heating rates presented here to those calculated from available electric-field noise models. We can tightly constrain a subset of these models based on their expected frequency and temperature scaling interdependence. Discrepancies between the measured results and predicted values point to the need for refinement of theoretical noise models in order to more fully understand the mechanisms behind motional trapped-ion heating.

arXiv comment6 pages, 3 figures, 2 tables

References in corpus (12)

• Heating of trapped ions from the quantum ground state
• Scaling and Suppression of Anomalous Quantum Decoherence in Ion Traps
• Suppression of Heating Rates in Cryogenic Surface-Electrode Ion Traps
• Reduction of anomalous heating in an in-situ-cleaned ion trap
• Temperature Dependence of Electric Field Noise Above Gold Surfaces
• Randomized Benchmarking of Multi-Qubit Gates
• A microscopic model of electronic field noise heating in ion traps
• Demonstration of a dressed-state phase gate for trapped ions
• Reduction of heating rate in a microfabricated ion trap by pulsed-laser cleaning
• Loading of a surface-electrode ion trap from a remote, precooled source
• Saturation of Two Level Systems and Charge Noise in Josephson Junction Qubits
• Influence of monolayer contamination on electric-field-noise heating in ion traps

Cited by in corpus (39)

• Trapped-Ion Quantum Computing: Progress and Challenges
• Ion-trap measurements of electric-field noise near surfaces
• Integrated multi-wavelength control of an ion qubit
• Cryogenic Trapped-Ion System for Large Scale Quantum Simulation
• High-sensitivity, spin-based electrometry with an ensemble of nitrogen-vacancy centers in diamond
• Engineering of Microfabricated Ion Traps and Integration of Advanced On-Chip Features
• Controlling systematic frequency uncertainties at the $10^{-19}$ level in linear Coulomb crystals
• Chip-integrated voltage sources for control of trapped ions
• Scalable Loading of a Two-Dimensional Trapped-Ion Array
• Distance scaling of electric-field noise in a surface-electrode ion trap
• Implementation of Chiral Quantum Optics with Rydberg and Trapped-ion Setups
• Electric-field noise from thermally-activated fluctuators in a surface ion trap
• Evidence for multiple mechanisms underlying surface electric-field noise in ion traps
• Reduction of trapped ion anomalous heating by in situ surface plasma cleaning
• Measurements of trapped-ion heating rates with exchangeable surfaces in close proximity
• Measurement of ultra-low heating rates of a single antiproton in a cryogenic Penning trap
• Implications of surface noise for the motional coherence of trapped ions
• Hybrid Oscillator-Qubit Quantum Processors: Instruction Set Architectures, Abstract Machine Models, and Applications
• Coherent rotations of qubits within a multi-species ion-trap quantum computer
• Spatially resolved surface dissipation over metal and dielectric substrates
• Technologies for trapped-ion quantum information systems
• A Study on Fast Gates for Large-Scale Quantum Simulation with Trapped Ions
• Observation of superconductivity and surface noise using a single trapped ion as a field probe
• Method for Determination of Technical Noise Contributions to Ion Motional Heating
• Spin readout of trapped electron qubits
• Effects of electrode surface roughness on motional heating of trapped ions
• Coherence properties of highly-excited motional states of a trapped ion
• Far-from-equilibrium noise heating and laser cooling dynamics in radio-frequency Paul traps
• Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor
• Low-temperature environments for quantum computation and quantum simulation
• Entangling-gate error from coherently displaced motional modes of trapped ions
• Simulating open-system molecular dynamics on analog quantum computers
• Electric field noise in a high-temperature superconducting surface ion trap
• Fast mixed-species quantum logic gates for trapped-ion quantum networks
• Test and characterization of multilayer ion traps on fused silica
• A simplified Mølmer-Sørensen gate for the trapped ion quantum computer
• High-speed and high-connectivity two-qubit gates in long chains of trapped ions
• Error-Resilient Fast Entangling Gates for Scalable Ion-Trap Quantum Processors
• Surface science motivated by heating of trapped ions from the quantum ground state