Method for Determination of Technical Noise Contributions to Ion Motional Heating

Abstract

Microfabricated Paul ion traps show tremendous promise for large-scale quantum information processing. However, motional heating of ions can have a detrimental effect on the fidelity of quantum logic operations in miniaturized, scalable designs. In many experiments, contributions to ion heating due to technical voltage noise present on the static (DC) and radio frequency (RF) electrodes can be overlooked. We present a reliable method for determining the extent to which motional heating is dominated by residual voltage noise on the DC or RF electrodes. Also, we demonstrate that stray DC electric fields can shift the ion position such that technical noise on the RF electrode can significantly contribute to the motional heating rate. After minimizing the pseudopotential gradient experienced by the ion induced by stray DC electric fields, the motional heating due to RF technical noise can be significantly reduced.

8 pages, 4 figures

References in corpus (3)

• Measurement of Ion Motional Heating Rates over a Range of Trap Frequencies and Temperatures
• Scalable Loading of a Two-Dimensional Trapped-Ion Array
• Dynamics and control of fast ion crystal splitting in segmented Paul traps

Cited by in corpus (5)

• Trapped-Ion Quantum Computing: Progress and Challenges
• Chip-integrated voltage sources for control of trapped ions
• A cryogenic radio-frequency ion trap for quantum logic spectroscopy of highly charged ions
• Observation of superconductivity and surface noise using a single trapped ion as a field probe
• Far-from-equilibrium noise heating and laser cooling dynamics in radio-frequency Paul traps