Second order resonant Raman scattering in single layer tungsten disulfide (WS)
arXiv:1406.3511 · doi:10.1103/PhysRevB.89.245442
Abstract
Resonant Raman spectra of single layer WS flakes are presented. A second order Raman peak (2LA) appears under resonant excitation with a separation from the E mode of only cm. Depending on the intensity ratio and the respective line widths of these two peaks, any analysis which neglects the presence of the 2LA mode can lead to an inaccurate estimation of the position of the E mode, leading to a potentially incorrect assignment for the number of layers. Our results show that the intensity of the 2LA mode strongly depends on the angle between the linear polarization of the excitation and detection, a parameter which is neglected in many Raman studies.
arXiv comment6 pages, 4 figures
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- Resonant Raman and photoluminescence spectra of suspended molybdenum disulfide
- Electron-phonon and phonon-phonon anharmonic interactions in 2H-MoX2 (X=S, Te): A comprehensive Resonant Raman study
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- Anisotropic Electron-Photon-Phonon Coupling in Layered MoS2
- Incoherent phonon population and exciton-exciton annihilation in monolayer WS2 revealed by time-resolved spontaneous Raman scattering
- Revealing the nature of excitons in liquid exfoliated monolayer WS2
- Influence of direct deposition of dielectric materials on the optical response of monolayer WS
- Raman Scattering with infrared excitation resonant with MoSe indirect band gap
- Morphology-induced spectral modification of self-assembled WS2 pyramids
- Symmetric Domain Segmentation in WS2 Flakes: Correlating spatially resolved photoluminescence, conductance with valley polarization